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This paper is a revised and updated version of the keynote speaker address for the Block 2 Session: “Data Acquisition in Surface Texture Analysis” for the Online Workshop on Quantitative Artifact Microwear Analysis (QAMA) organized by TraCEr–MONREPOS–RGZM (November 25, 2021) in Neuwied, Germany. It discusses a number of issues related to the acquisition of surface data for texture analysis, including the transition from experimentation to artifact analysis and the importance of standardization of methods. Specifically, the keynote address focuses on eight sub-topics in relation to method development and standardization: (1) Microscopes and operating systems, (2) Magnification, depth of field, working distance, and field of view, (3) Numerical aperture, (4) Cleaning methods, (5) Number and location of surface measurements, (6) Profile versus area measurements, (7) Multiple measurements in the same location, and (8) Surface replication: molds/casts, surface images, and microCT.
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