Uses of a new asymmetric loss-based process capability index in the electronic industries

Abstract

This article suggests a novel process capability index (PCI) termed as Spk″, which is based on an asymmetric loss function (linear exponential) for a normal process and offers a specific method of incorporating the loss in capability analysis. Next, we estimate the suggested PCI using the moment estimation approach when the process follows a normal distribution, and we compare the effectiveness of the investigated estimation methods in terms of their mean squared errors through simulation analysis. Additionally, the confidence intervals for the index Spk″ are constructed using the generalized confidence interval (GCI) and parametric bootstrap confidence interval (BCI) approach. Using Monte Carlo simulation, the performance of the GCI and BCI is compared in terms of average width, associated coverage probabilities, and relative coverage. Finally, three real data sets from the electronic industries are re-analyzed to show the usefulness of the suggested index, MOM estimation, GCI and BCI.

Cite this work

No public copy is stored for this record, so only the metadata is cited.

Stored only when both papers are in the corpus — 7 citations exist upstream.

Papers that cite the same references — the relational fallback while embeddings are still backfilling.