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Frans A. Spaepen · Study

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Frans A. Spaepen

1 works· latest 1999· 1 institutionscluster: provisionalORCID 0000-0002-2560-7736

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New methods for determining the void content of silicon single crystals1999 · 10 citations

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New methods for determining the void content of silicon single crystals

IEEE Transactions on Instrumentation and Measurement·1999·2 authors

10citations