Stanford‐Binet Intelligence Scales

Abstract

Abstract Originally released in 1905 by Alfred Binet and Theodore Simon, the Binet‐Simon Intelligence Scale marked the beginning of a new era in the measurement of intelligence. Initially designed as a diagnostic system primarily for identifying children with mental retardation, the first edition of the Binet‐Simon Intelligence Scale included 30 pass‐fail items such as word problems, paper cutting, and repeating sentences and digits. The original concepts, such as presenting items of varying levels of difficulty, the use of age‐graded norms to predict mental age, and the provision of standardized instructions for administration, set the precedent for the development of future measures of intelligence.

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