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Critical review of the current status of thickness measurements for ultrathin SiO 2 on Si Part V: Results of a CCQM pilot study

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References

1936Tables of Physical and Chemical Constants1,294 cited
2000CODATA recommended values of the fundamental physical constants: 1998768 cited
1921Tables of Physical and Chemical Constants519 cited
1999CODATA Recommended Values of the Fundamental Physical Constants: 1998313 cited

Cited by

2016Realization of the kilogram by the XRCD method133 cited
2011Surface layer determination for the Si spheres of the Avogadro project77 cited
2009Ultra‐thin SiO 2 on Si IX: absolute measurements of the amount of silicon oxide as a thickness of SiO 2 on Si43 cited
2011The Avogadro constant: determining the number of atoms in a single-crystal 28Si sphere33 cited
2020The lattice parameter of silicon: a secondary realisation of the metre31 cited
2012The new kilogram definition based on counting the atoms in a28Si crystal27 cited
2008Oxide Layer Mass Determination at the Silicon Sphere of the Avogadro Project22 cited
2019Silicon spheres for the future realization of the kilogram and the mole16 cited
2013The Avogadro constant and a new definition of the kilogram10 cited
2021Review on the thickness measurement of ultrathin oxide films by mutual calibration method8 cited

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2017

Application of ellipsometry for the accurate oxide layer measurement on silicon spheres

8 cited