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Statistical control of VLSI fabrication processes. A framework
3 references·1 citing·11 second hop
Statistical control of VLSI fabrication processes. A framework (1988)Statistical control of VLSI fabrication p…Quality Engineering through Design Optimization (1989)Quality Engineering through D…An Efficient Method of Sampling for Statistical Circuit Design (1986)An Efficient Method of Sampli…Yield maximization and worst-case design with arbitrary statistical distributions (1980)Yield maximization and worst-…Statistical control of VLSI fabrication processes. II. A software system (1988)Statistical control of VLSI f…Statistics for experimenters. An introduction to design, data analysis, and model building. (1978)Statistics for Experimenters: An Introduction to Design, Data Analysis and Model Building. (1979)Performance Measures Independent of Adjustment: An Explanation and Extension of Taguchi's Signal-to-Noise Ratios (1987)Optimization of product and process design for quality and cost (1988)Performance Measures Independent of Adjustment: an Explanation and Extension of Taguchi’s Signal-To-Noise Ratios (1989)Fundamental Concepts in the Design of Experiments (2000)Statistical design centering and tolerancing using parametric sampling (1981)A Guide to Simulation (1983)Sensitivity and Optimization (2014)Modern factor analysis (1960)Modern Factor Analysis (1968)
this work references cited by second hop

References

  • 1989Quality Engineering through Design Optimization290 cited
  • 1980Yield maximization and worst-case design with arbitrary statistical distributions51 cited
  • 1986An Efficient Method of Sampling for Statistical Circuit Design23 cited

Cited by

  • 1988Statistical control of VLSI fabrication processes. II. A software system12 cited

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