THE APPLICATION OF TIME‐OF‐FLIGHT SECONDARY ION MASS SPECTROMETRY (ToF‐SIMS) TO THE CHARACTERIZATION OF OPAQUE ANCIENT GLASSES*

Frank J. M. Rutten · D. Briggs · Julian Henderson · Martin J. Roe

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Cultural Heritage Materials Analysis Glass properties and applications Ion-surface interactions and analysis

Abstract

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) has been used, for the first time, for the characterization of opaque ancient glasses. Isotope‐specific chemical imaging with sub‐micron resolution enabled the separate analysis of opacifiying inclusions and the surrounding glass matrix. Phase identification has been demonstrated and quantification of the matrix composition has been investigated by use of Corning Glass Standard B as a model. Trace element detection limits are typically in the range 0.5–5.0 ppm atomic—in favourable cases down to 0.01 ppm. For the analysis of inclusions in particular, this has the potential to provide new information of use in establishing provenance and trade routes by ‘fingerprinting’ as well as the investigation of manufacturing techniques, as demonstrated by comparisons between glasses and with EDX data from the same samples.

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References

2000Ancient Egyptian materials and technology 2000Modern analytical methods in art and archaeology 1985THE RAW MATERIALS OF EARLY GLASS PRODUCTION 2006Trace element discriminants between Egyptian and Mesopotamian Late Bronze Age glasses 2002The use and origin of antimonate colorants in early Egyptian glass*2001Mass spectrometry with laser sampling: A new tool to characterize archaeological materials 1993Studies in early Egyptian glass 2013The Science and Archaeology of Materials

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2020Preliminary Thermal Investigations of Calcium Antimonate Opacified White Glass Tesserae 2012Opacifiers in Late Bronze Age glasses: the use of ToF-SIMS to identify raw ingredients and production techniques

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