Article2004

Statistical analysis of key comparisons with linear trends

Nien Fan Zhang · Hung-Kung Liu · Nell Sedransk · William E. Strawderman

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Scientific Measurement and Uncertainty Evaluation Calibration and Measurement Techniques Advanced Electrical Measurement Techniques

Abstract

A statistical analysis for key comparisons with linear trends is proposed. The approach has the advantage that it is consistent with the no-trend cases. The uncertainties for the key comparison reference value, which is time dependent in this case, and the degrees of equivalence are also provided. As an example, the approach is applied to key comparison CCEM-K2.

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2002The evaluation of key comparison data 2002Final report on key comparison CCEM-K2 of resistance standards at 10 M and 1 G

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2005Chi-squared statistics for KCRV candidates 2005Statistical analysis for multiple artefact problem in key comparisons with linear trends 2005Bayesian approach to assessing uncertainty and calculating a reference value in key comparison experiments 2015Explanatory power of degrees of equivalence in the presence of a random instability of the common measurand 2008An Introduction to Data Modeling Principles in Metrology and Testing 2011Analysis of interlaboratory comparisons affected by correlations of the reference standards and drift of the travelling standards 2009A generalized method for the multiple artefacts problem in interlaboratory comparisons with linear trends

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