Parameters Variability Effects on Multiconductor Interconnects via Hermite Polynomial Chaos

Abstract

This paper focuses on the derivation of an enhanced transmission-line model allowing the stochastic analysis of a realistic multiconductor interconnect. The proposed model, which is based on the expansion of the well-known telegraph equations in terms of orthogonal polynomials, includes the variability of geometrical or material properties of the interconnect due to uncertainties like fabrication process or temperature. A real application example involving the frequency-domain analysis of a coupled microstrip and the computation of the parameters variability effects on the transmission-line response concludes this paper.

Cite this work

No public copy is stored for this record, so only the metadata is cited.

Stored only when both papers are in the corpus — 97 citations exist upstream.

Papers that cite the same references — the relational fallback while embeddings are still backfilling.