Article1997

Progress in the measurement of lattice spacing d(220) of silicon

Unknown author

49 citations0/0 files storedIEEE Transactions on Instrumentation and Measurement

No readable copy stored yet — this record is metadata only.

No open-access location is known for this record yet.

Literature note Cite in a project Citation map

Scientific Measurement and Uncertainty Evaluation X-ray Diffraction in Crystallography Advanced Measurement and Metrology Techniques

Abstract

X-ray and optical interferometry is applied to the measurement of silicon lattice spacing. The previously reported standard deviation 0.16/spl times/10/sup -6/ has been reduced to 0.05/spl times/10/sup -6/. The d(220) is 192015.593(0.01) fm after correction of lattice strain by carbon and oxygen.

Paper brief

Loading…

Cite this work

Citation unavailable for this work.

BibTeX RIS CSL-JSON

No public copy is stored for this record, so only the metadata is cited.

Citations in this library

Citation map →

Stored only when both papers are in the corpus — 49 citations exist upstream.

References

1974Determination of the Avogadro Constant 1990Silicon lattice parameters as an absolute scale of length for high precision measurements of fundamental constants 1982The lattice parameter of highly pure silicon single crystals 1992A determination of the Avogadro Constant 1976Avogadro Constant—Corrections to an Earlier Report 1995A new determination of N/sub A/1995Absolute measurement of the density of silicon crystals in vacuo for a determination of the Avogadro constant

Cited by

2003Evaluation of the molar volume of silicon crystals for a determination of the avogadro constant 2004Density comparison measurements of silicon crystals by a pressure-of-flotation method at NMIJ 2003Measurement repetitions of the Si(220) lattice spacing 1999About the existing discrepancy in the determinations of the Avogadro constant 2011Homogeneity characterization of lattice spacing of silicon single crystals by a self-referenced lattice comparator 2007Confirmation of the INRiM and PTB Determinations of the Si Lattice Parameter

Explore the map →

Papers that cite the same references — the relational fallback while embeddings are still backfilling.

Imported from OpenAlex (CC0) — nothing here is generated.