Integrated design of run-to-run PID controller and SPC monitoring for process disturbance rejection

Fugee Tsung · Jianjun Shi

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Advanced Statistical Process Monitoring Advanced Control Systems Optimization Fault Detection and Control Systems

Abstract

An integrated design methodology has been developed for a run-to-run PID controller and SPC monitoring for the purpose of process disturbance rejection. In the paper, the process disturbance is assumed to be an ARMA (1,1) process. A detailed procedure is developed to design a PID controller which minimizes process variability. The performance of the PID controller is also discussed. A joint monitoring of input and output, using Bonferroni's approach, is then designed for the controlled process. The ARL performance is studied. One major contribution of the paper is to develop a complete procedure and design plots, which serve as tools to conduct all the aforementioned tasks. An example is provided to illustrate the integrated design approach.

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References

1977Time Series Analysis: Forecasting and Control 1992Introduction to Statistical Quality Control 1982Out of the Crisis 1978Time Series Analysis: Forecasting and Control.1992A Multivariate Exponentially Weighted Moving Average Control Chart 1973Time Series Analysis Forecasting and Control.1988Time-Series Modeling for Statistical Process Control 1991Some Statistical Process Control Methods for Autocorrelated Data

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