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Status of a silicon lattice measurement and dissemination exercise

Richard D. Deslattes · Ernest G. Kessler

12 citations0/0 files storedConference on Precision Electromagnetic Measurements

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Scientific Measurement and Uncertainty Evaluation X-ray Diffraction in Crystallography Advanced Measurement and Metrology Techniques

Abstract

Summary form only given. Work on lattice period measurement in monocrystalline silicon is described. An upgraded X-ray/optical interferometer and a recently developed lattice comparator are being used in the investigation. Each instrument is seen as having a potential accuracy approaching or exceeding 0.01 ppm, yet this accuracy has not been realized. The reasons for this are discussed.>

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References

1974Determination of the Avogadro Constant 1990Silicon lattice parameters as an absolute scale of length for high precision measurements of fundamental constants 1982The lattice parameter of highly pure silicon single crystals 1976Avogadro Constant—Corrections to an Earlier Report 1987Remeasurement of a Silicon lattice period 1991Volume and density measurements for the IMGC Avogadro experiment

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