Designing a variables two-plan sampling system with adjustable acceptance criteria for lot disposition

Abstract

The variables acceptance sampling plan and variables acceptance sampling system (VASS) based on process capability indices (PCIs) have gotten greater attention recently because they can efficiently validate product quality in variables measurement scales. In the VASS, the variables quick-switch sampling system (VQSS) and variables tightened-normal-tightened sampling system (VTSS) are the basic two-plan sampling systems. Compared to the VQSS, the VTSS is more flexible and adaptive because it empowers practitioners to adjust the rule-switch mechanism. Recent studies on the PCI-based VTSS have only focused on the sample size type, denoted as VTSS-I. However, VTSS-I requires a large sample size in the tightened inspection, leading to increased inspection costs and delays in distribution. In this article, we proposed an acceptance criterion-type VTSS, denoted as VTSS-II, based on unilateral PCIs. By comparing the proposed VTSS-II with the existing VTSS-I, the VTSS-II can significantly reduce the inspected sample size and has superior discrimination power. Because the rule-switch mechanism of the VTSS-II is adjustable, we created a cloud-computing app to provide an easy way for practitioners to obtain the optimum system design.

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