Article2007

A Possible Solution for the Discrepancy Between the INRIM and NMIJ Values of the Si Lattice-Parameter

9 citations0/0 files storedIEEE Transactions on Instrumentation and Measurement

No readable copy stored yet — this record is metadata only.

No open-access location is known for this record yet.

Literature note Cite in a project Citation map

Scientific Measurement and Uncertainty Evaluation X-ray Diffraction in Crystallography Advanced Measurement and Metrology Techniques

Abstract

We present the results of a joint project to identify the origin of a discrepancy between the value of the Si lattice- parameter obtained by the Istituto Nazionale di Ricerca Metrologica and that obtained by the National Metrology Institute of Japan. The re-evaluation of diffraction in the laser interferometry indicates that misalignment of the interfering beams could account for the observed difference.

Paper brief

Loading…

Cite this work

Citation unavailable for this work.

BibTeX RIS CSL-JSON

No public copy is stored for this record, so only the metadata is cited.

Citations in this library

Citation map →

Stored only when both papers are in the corpus — 9 citations exist upstream.

References

1994Measurement of the silicon (220) lattice spacing 1997Progress in the measurement of lattice spacing d(220) of silicon 2003Measurement repetitions of the Si(220) lattice spacing 2007Confirmation of the INRiM and PTB Determinations of the Si Lattice Parameter 2004Measurement repetitions of the Si (220) lattice spacing

Explore the map →

Papers that cite the same references — the relational fallback while embeddings are still backfilling.

Imported from OpenAlex (CC0) — nothing here is generated.