A shewhart‐like charting technique for high yield processes

Abstract

Abstract A Shewhart‐like charting technique is developed in this paper to overcome the difficulties the traditional control chart encounters in the control of processes with a very low fraction non‐conforming. The technique uses the number of conforming items between two consecutive non‐conforming ones to monitor the fraction non‐conforming of a process, leading to a chart that is informative and easy to interpret. The approach discussed is especially suitable for real‐time and automatic statistical quality control.

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